Fig. 5
From: A review of deep learning applications for genomic selection
Histograms of the AUC criterion and their standard deviation (error bars) for the wheat (a) and maize (b) datasets. a: grain yield (GY) in seven environments (1–7) of classifiers MLP and PNN of the upper 15 and 30% classes; b: grain yield (GY) under optimal conditions (HI and WW) and stress conditions (LO and SS) of classifiers MLP and PNN in the upper 15 and 30% classes