Fig. 2From: Genome-wide association mapping reveals potential novel loci controlling stripe rust resistance in a Chinese wheat landrace diversity panel from the southern autumn-sown spring wheat zoneThe MLM Manhattan plot of stripe rust resistance significantly associated markers. The horizontal line shows the genome-wide significant threshold –log10(P) value of 3.0. The associated MTAs for IT of CYR32, CYR34 with seedling resistance, IT, FDS and AUDPC based on the BLUP from the inner circle to the outer circleBack to article page